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Probing structural changes of spin-coated polystyrene
film after swelling and precipitation by synchrotron GIUSAXS and AFM |
| Binbin SUN 1, Yuqing LAI 1, Yongfeng MEN 1, Yoong KIM 2, |
| 1.State Key Laboratory
of Polymer Physics and Chemistry, Changchun Institute of Applied Chemistry,
Chinese Academy of Sciences, Graduate School of Chinese Academy of
Sciences, Renmin Street 5625, 130022 Changchun, P.R. China; 2.Global Research Center
Singapore, BASF South East Asia Pte Ltd, 61 Science Park Road, #03-01
The Galen, Singapore Science Park II, Singapore 117525; |
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Abstract Polystyrene film of about 50 nm in thickness on silicon wafer was obtained by spin-coating in tetrahydrofuran solution. The film exhibits a rough surface as shown by atomic force microscopy images and ellipsometry data. Furthermore, such surface roughness produced a characteristic lateral correlation peak in an “out-of-plane” scan in the synchrotron grazing incidence ultra-small angle X-ray scattering pattern. The film was treated with liquids of solvent and non-solvent sequentially, resulting in a process of swelling and precipitation of the polystyrene film. Such a solvent/non-solvent treatment completely changed the original surface structure of the film. Aggregates of polystyrene of different sizes were observed both in atomic force microscopy and synchrotron grazing incidence ultra-small angle X-ray scattering measurements. The results demonstrate that synchrotron grazing incidence ultra-small angle X-ray scattering is a unique means to investigate large area micro-structural features of thin films supported on smooth surfaces.
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Issue Date: 05 September 2009
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Renaud, G.; Lazzari, R.; Revenant, C.; Barbier,; Noblet, A. M.; Ulrich, O.; Leroy, F.; Jupille, J.; Borensztein, Y.; Henry, C. R.; Deville, J. P.; Scheurer, F.; Mane-Mane, J.; Fruchart, O., Science2003, 300, 1416
doi: 10.1126/science.1082146
|
|
Narayanan, S.; Lee, D. R.; Guico, R. S.; Sinha, S. K.; Wang, J., Phys. Rev. Lett. 2005, 94, 145504
doi: 10.1103/PhysRevLett.94.145504
|
|
Winans, R. E.; Vajda, S.; Lee, B.; Riley, S. J., ; Seifert, S.; Tikhonov, G. Y.; Tomeczyk, N. A.J. Phys. Chem. B2004, 108, 18105
doi: 10.1021/jp045549p
|
|
Mueller-Buschbaum, P., Anal. Bioanal. Chem. 2003, 376, 3
|
|
Mueller-Buschbaum, P.; Wolkenhauer, M.; Wunnicke, O.; Stamm, M.; Cubitt, R.; Petry, W., Langmuir2001, 17, 5567
doi: 10.1021/la010448t
|
|
Busch, P.; Posselt, D.; Smilgies, D. M.; Rauscher, M.; Papadakis, C. M., Macromolecules2007, 40, 630
doi: 10.1021/ma061695c
|
|
Lee, B.; Park, I.; Yoon, J.; Park, S.; Kim, Jehan.; Kim, K.; Chang, T.; Ree, M., Macromolecules2005, 38, 4311
doi: 10.1021/ma047562d
|
|
Roth, S. V.; Doehrmann, R.; Dommach, M.; Kuhlmann, M.; Kroeger, I.; Gehrke, R.; Walter, H.; Schroer, C.; Lengeler, B.; Mueller-Buschbaum, P., Rev. Sci. Instrum. 2006, 77, 85106
doi: 10.1063/1.2336195
|
|
Petri, D. F. S., J. Braz. Chem. Soc. 2002, 13, 695
doi: 10.1590/S0103-50532002000500027
|
|
Shapovalov, S; Zaitsev, V. S.; Strzhemechny, Y.; Choudhery, F.; Zhao, W.; Scharz, S. A.; Ge, S; Shin, K.; Sokolov, J.; Rafailovich, M. H., Polymer. Int. 2000, 49, 432
doi: 10.1002/(SICI)1097-0126(200005)49:5<432::AID-PI282>3.0.CO;2-M
|
|
Yonda, Y., Phys. Rev. 1963, 131, 2010
doi: 10.1103/PhysRev.131.2010
|
|
Hu, S. S.; Rieger, J.; Roth, S.V.; Gehrke, R.; Leyrer, R.J.; Men, Y.F., Langmuir2009, 25, 4230
doi: 10.1021/la801527y
|
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