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Design, fabrication and characterization of dual-channel real space transfer transistor |
Weilian GUO(), Shilin ZHANG, Xin YU |
School of Electronic Information Engineering, Tianjin University, Tianjin 300072, China |
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Abstract In this paper, using a δ-doping dual-channel structure and GaAs substrate, a real space transfer transistor (RSTT) is designed and fabricated successfully. It has the standard Λ-shaped negative resistance I-V characteristics as well as a level and smooth valley region that the conventional RSTT has. The negative resistance parameters can be varied by changing gate voltage (VGS). For example, the PVCR varies from 2.1 to 10.6 while VGS changes from 0.6 V to 1.0 V. The transconductance for IP (ΔIP/ΔVGS) is 0.3 mS. The parameters of VP, VV and threshold gate voltage (VT) for negative resistance characteristics arising are all smaller than the value reported in the literature. Therefore, this device is suitable for low dissipation power application.
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Keywords
real space transfer transistor (RSTT)
high speed compound three terminal function device
three terminal negative resistance device
hot electron device
electron transfer device
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Corresponding Author(s):
GUO Weilian,Email:xinyufisher@gmail.com
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Issue Date: 05 June 2009
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