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Frontiers of Electrical and Electronic Engineering

ISSN 2095-2732

ISSN 2095-2740(Online)

CN 10-1028/TM

Front Elect Electr Eng Chin    2010, Vol. 5 Issue (4) : 505-509    https://doi.org/10.1007/s11460-010-0097-8
RESEARCH ARTICLE
Simplified parasitic capacitance extraction of shield in HVDC converter system with boundary element method
Shili LIU(), Zezhong WANG, Jing SUN
Beijing Key Laboratory of High Voltage & EMC, North China Electric Power University, Beijing 102206, China
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Abstract

It is critical to build a wide-band circuit model to conduct research on the characteristics of the electromagnetic disturbance source during the localization of high voltage direct current (HVDC) technology. Parasitic capacitance is most essential for modeling the equivalent circuit, so a fast and accurate computation of capacitance parameters plays a vital role. Because of the large size and complex structure of the converter equipment, it is impossible to obtain capacitance parameters by means of measurement or simulating calculation with finite element software. In this paper, a simplified method of capacitance extraction based on boundary element method is proposed, which can provide an efficient means of establishing simulation models. In the method presented, simulation model of the shield may not be chamfered. Consequently, the edge and corner of the shield do not need to be handled with a sphere, cylinder and other curved surface model. The availability of this method is demonstrated by comparing the capacitance parameters of chamfered shield with that of non-chamfered shield.

Keywords parasitic capacitance      shield      chamfer      boundary element method (BEM)      simplified model      extraction     
Corresponding Author(s): LIU Shili,Email:liushili994102@yahoo.com.cn   
Issue Date: 05 December 2010
 Cite this article:   
Shili LIU,Zezhong WANG,Jing SUN. Simplified parasitic capacitance extraction of shield in HVDC converter system with boundary element method[J]. Front Elect Electr Eng Chin, 2010, 5(4): 505-509.
 URL:  
https://academic.hep.com.cn/fee/EN/10.1007/s11460-010-0097-8
https://academic.hep.com.cn/fee/EN/Y2010/V5/I4/505
Fig.1  Meshing model for box-plate structure
structurelength × width × heightsimulated resultmeasured result
box0.205 m × 0.165 m × 0.085 m11.1 pF11.2 pF
plate3.2 m × 2.3 m × 0.005 m
Tab.1  capacitance and parameters for box-plate structure
Fig.2  Shield of converter system tower
Fig.3  Schematic diagram of numbering for shielding sheets
Fig.4  Schematic diagram of fillet for shielding sheet
Fig.5  Meshing model for A and L sheets with neither of them chamfered
Fig.6  Meshing model for A and L sheets with only A sheet chamfered
Fig.7  Meshing model for A and L sheets with both of them chamfered
A and L sheetsneither of them chamferedonly A sheet chamferedboth of them chamfered
CAL/pF7.136.886.66
CA0/pF2.352.242.22
Tab.2  Parasitic capacitance of A and L sheets
A and C sheetsneither of them chamferedonly A sheet chamferedboth of them chamfered
CAC/pF6.155.925.71
CA0/pF2.342.242.22
Tab.3  Parasitic capacitance of A and C metal sheets
A and F sheetsneither of them chamferedonly A sheet chamferedboth of them chamfered
CAF/pF5.064.874.72
CA0/pF 2.352.232.23
Tab.4  Parasitic capacitance of A and F metal sheets
chamfered statecapacitance parameters error/%
CALCACCAF
only A sheet chamfered3.33.73.2
neither of them chamfered7.17.77.2
Tab.5  Capacitance parameters error
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