Phase change effect of low melting point metal for an automatic cooling of USB flash memory

doi:10.1007/s11708-012-0204-z

Front Energ

2012, Vol. 6

Issue (3) : 207-209 https://doi.org/10.1007/s11708-012-0204-z

SHORT COMMUNICATION

Phase change effect of low melting point metal for an automatic cooling of USB flash memory

Haoshan GE¹, Jing LIU²(

)

1. Key Laboratory of Cryogenics, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100190, China; 2. Key Laboratory of Cryogenics, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Bejing 100190, China; Department of Biomedical Engineering, School of Medicine, Tsinghua University, Beijing 100084, China

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Corresponding Author(s): LIU Jing,Email:jliubme@tsinghua.edu.cn

Issue Date: 05 September 2012

Cite this article:

Haoshan GE,Jing LIU. Phase change effect of low melting point metal for an automatic cooling of USB flash memory[J]. Front Energ, 2012, 6(3): 207-209.

URL:

https://academic.hep.com.cn/fie/EN/10.1007/s11708-012-0204-z
https://academic.hep.com.cn/fie/EN/Y2012/V6/I3/207

Fig.1 Schematic diagram of experimental setup

Fig.2 Temperature curves of the USB flash memory in use and the environment.(A) Temperature of the tested USB flash memory; (B) temperature of the testing environment

Fig.3 Temperature curves of the original and modified USB flash memory in use and the environment. (A) Temperature of the original USB flash memory without any cooling device; (B) temperature of the modified USB flash memory with gallium filled in the container; (C) temperature of the testing environment

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