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Frontiers of Optoelectronics

ISSN 2095-2759

ISSN 2095-2767(Online)

CN 10-1029/TN

Postal Subscription Code 80-976

Front Optoelec    2012, Vol. 5 Issue (1) : 73-77    https://doi.org/10.1007/s12200-012-0187-8
RESEARCH ARTICLE
Thermal analysis for fast thermal-response Si waveguide wrapped by SiN
Rui MIN, Ruiqiang JI, Lin YANG()
Optoelectronic System Laboratory, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
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Abstract

A new type of Si waveguide wrapped by silicon nitride (SiN) is designed, and its optical and thermal analysis are presented. The thickness of SiN up-cladding should be larger than 1 μm in order to prevent the absorption of optical field by metal heater. Thermal response of the proposed waveguide structure is enhanced by the high thermal conductivity of SiN. Moreover, this thermal response can be further improved by a fast heat dissipation channel created in this structure. Our simulation results indicate that a rise time of about 110 ns can be achieved for the proposed waveguide structure, which is about two orders of magnitude less than that of the conventional Si waveguide. The influences of the thickness of up-cladding and the stretching width and etching depth on the thermal performance are also discussed. The simulation shows thin up-cladding, large stretching width and etching depth are critical to enhance the thermal response speed.

Keywords thermo-optic      SiN      Si      waveguide      rise time     
Corresponding Author(s): YANG Lin,Email:lyang@semi.ac.cn   
Issue Date: 05 March 2012
 Cite this article:   
Lin YANG,Rui MIN,Ruiqiang JI. Thermal analysis for fast thermal-response Si waveguide wrapped by SiN[J]. Front Optoelec, 2012, 5(1): 73-77.
 URL:  
https://academic.hep.com.cn/foe/EN/10.1007/s12200-012-0187-8
https://academic.hep.com.cn/foe/EN/Y2012/V5/I1/73
Fig.1  Cross-section of Si waveguide wrapped by SiN
materialrefractive index at 1.55 μmextinction coefficient at 1.55 μmthermal conductivity /(W·(m·K)-1)specific heat /(J·(kg·K)-1)density /(kg·m-3)
Si3.476-1487102.33×103
SiO21.445-1.277452.3×103
SiN1.914.9×10-6301702.5×103
Cr3.6744.1993.74507.14×103
Tab.1  Thermal and optical parameters of materials used in calculation
Fig.2  Calculated effective extinction coefficient of Si waveguide wrapped by SiN with different up-cladding thicknesses
Fig.3  Cross section of conventional Si waveguide
Fig.4  (a) Temperature response of Si waveguide wrapped by SiN with different etching depths ; (b) rise time versus etching depths ; (c) temperature change versus etching depths . Corresponding curves of conventional Si waveguide are shown in red lines as references
Fig.5  (a) Temperature response of Si waveguide wrapped by SiN with different stretching widths and etching depths ; (b) rise time versus stretching width for different etching depths ; (c) temperature change versus stretching width for different etching depths
Fig.6  (a) Temperature response of Si waveguide wrapped by SiN with different up-cladding thicknesses; (b) rise time versus up-cladding thicknesses
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