Optical performance of ultra-thin silver films under the attenuated total reflection mode

doi:10.1007/s12200-016-0574-7

Front. Optoelectron.

2016, Vol. 9

Issue (4) : 549-554 https://doi.org/10.1007/s12200-016-0574-7

RESEARCH ARTICLE

Optical performance of ultra-thin silver films under the attenuated total reflection mode

Ming ZHOU¹(

),Sheng ZHOU¹,Gang CHEN¹,Yaopeng LI¹,Dingquan LIU^1,²

¹. Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
². School of Physical Science and Technology, ShanghaiTech University, Shanghai 200031, China

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Abstract

Ultra-thin silver films were deposited by thermal evaporation, and the dielectric functions of samples were simulated using Drude-Lorentz oscillators. When s-polarized incident light from the BK7 glass into thin silver film at 45° angle using attenuated total reflection (ATR) mode, we experimental observed that the reflection reach a minimum of 1.87% at 520 nm for thickness of d~6.3 nm silver film, and it reach a minimum of 10.1% at 500 nm for thickness of d~4.1 nm. Moreover, we simulated the absorption changes with incident angles at 520 nm for both p-polarized (TM wave) and s-polarized (TE wave) light using transfer matrix theory, and calculated the electric field distributions. The absorption as a function of incident angles of TM wave and TE wave showed different characteristics under ATR mode, TE wave reached the maximum absorption around the critical angle θ_c~41.1°, while TM wave reached the minimum absorption.

Keywords silver films transfer matrix theory absorption ellipsometer

Corresponding Author(s): Ming ZHOU

Just Accepted Date: 06 June 2016 Online First Date: 27 June 2016 Issue Date: 29 November 2016

Cite this article:

Ming ZHOU,Sheng ZHOU,Gang CHEN, et al. Optical performance of ultra-thin silver films under the attenuated total reflection mode[J]. Front. Optoelectron., 2016, 9(4): 549-554.

URL:

https://academic.hep.com.cn/foe/EN/10.1007/s12200-016-0574-7
https://academic.hep.com.cn/foe/EN/Y2016/V9/I4/549

Fig.1 ATR configuration (triangular prism) of reflection measurement

Fig.2 Dielectric functions (a) and transmittances (b) of ultra-thin silver films (normal incidence)

Fig.3 SEM (a) and AFM (b) surface morphologies of Ag-II

Fig.4 Actual and measured reflectance using the ATR configuration of s-polarized

Fig.5 Measured and calculated absorption of samples for s-polarized light

Fig.6 Absorption as a function of incident angles of Ag-II simulated by the transfer matrix method. (a) TE; (b) TM

Fig.7 Absorption as a function of wavelength of Ag-II simulated by transfer matrix theory

Fig.8 Electric field distribution of TE and TM wave for Ag-II (q=45°, 520 nm)

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