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Quantitative modeling of perovskite-based direct X-ray flat panel detectors |
Zihao Song1, Gaozhu Wang1, Jincong Pang1( ), Zhiping Zheng3, Ling Xu1, Ying Zhou1, Guangda Niu1,2, Jiang Tang1,2,3() |
1. Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China
2. Optical Valley Laboratory, Wuhan 430074, China
3. School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China |
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Abstract Direct X-ray detectors based on semiconductors have drawn great attention from researchers in the pursuing of higher imaging quality. However, many previous works focused on the optimization of detection performances but seldomly watch them in an overall view and analyze how they will influence the detective quantum efficiency (DQE) value. Here, we propose a numerical model which shows the quantitative relationship between DQE and the properties of X-ray detectors and electric circuits. Our results point out that pursuing high sensitivity only is meaningless. To reduce the medical X-ray dose by 80%, the requirement for X-ray sensitivity is only at a magnitude of 103 µCGy-1·cm-2. To achieve the DQE = 0.7 at X-ray sensitivity air from 1248 to 8171 µCGy-1air·cm-2, the requirements on dark current density ranges from 10 to 100 nA·cm-2 and the fluctuation of current density should fall in 0.21 to 1.37 nA·cm-2.
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| Keywords
DQE
X-ray
Detector
Perovskite
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Corresponding Author(s):
Jincong Pang,Jiang Tang
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Issue Date: 14 October 2024
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