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A review of crystallographic textures in chemical
vapor-deposited diamond films |
| Tao LIU1,Dierk RAABE1,Wei-Min MAO2, |
| 1.Max-Planck-Institut für
Eisenforschung, Abteilung Mikrostrukturphysik und Umformtechnik, Max-Planck-Strasse
1, Düsseldorf 40237, Germany; 2.School of Materials Science
and Engineering, University of Science and Technology Beijing, Beijing
100083, China; |
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Abstract Diamond is one of the most important functional materials for film applications due to its extreme physical and mechanical properties, many of which depend on the crystallographic texture. The influence of various deposition parameters matters to the texture formation and evolution during chemical vapor deposition (CVD) of diamond films. In this overview, the texture evolutions are presented in terms of both simulations and experimental observations. The crystallographic textures in diamond are simulated based on the van der Drift growth selection mechanism. The film morphology and textures associated with the growth parameters α (proportional to the ratio of the growth rate along the〈100〉direction to that along the 〈111〉direction) are presented and determined by applying the fastest growth directions. Thick films with variations in substrate temperature, methane concentration, film thickness, and nitrogen addition were analyzed using high-resolution electron back-scattering diffraction (HR-EBSD) as well as X-ray diffraction (XRD), and the fraction variations of fiber textures with these deposition parameters were explained. In conjunction with the focused ion beam (FIB) technique for specimen preparation, the grain orientations in the beginning nucleation zones were studied using HR-EBSD (50nm step size) in another two sets of thin films deposited with variations in methane concentration and substrate material. The microstructures, textures, and grain boundary character were characterized. Based on the combination of an FIB unit for serial sectioning and HR-EBSD, diamond growth dynamics was observed using a 3D EBSD technique, with which individual diamond grains were investigated in 3D. Microscopic defects were observed in the vicinity of the high-angle grain boundaries by using the transmission electron microscopy (TEM) technique, and the advances of TEM orientation microscopy make it possible to identify the grain orientations in nano-crystalline diamond.
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| Keywords
CVD diamond films
deposition parameters
texture
EBSD
van der Drift growth selection mechanism
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Issue Date: 05 March 2010
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