Abstract：This review has introduced a new near-field optical microscope (NOM) atomic force microscope combined with photon scanning tunneling microscope (AF/PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM ) has also been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM.
出版日期: 2006-09-05
引用本文:
. Review of near-field optical microscopy[J]. Frontiers of Physics in China - Selected Publications from Chinese Universities, 2006, 1(3): 263-274.
WU Shi-fa. Review of near-field optical microscopy. Front. Phys. , 2006, 1(3): 263-274.
