Theory of the resonance escape factors of plasma
resonance lines basing on the exact Voigt profile

doi:10.1007/s11467-008-0020-4

Frontiers of Physics in China - Selected Publications from Chinese Universities

2008, Vol. 3

Issue (3): 264-268 https://doi.org/10.1007/s11467-008-0020-4

本期目录

Theory of the resonance escape factors of plasma resonance lines basing on the exact Voigt profile

ZHANG Qing-guo, HE Jian

School of Science, Henan University of Science and Technology;

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Abstract：In this paper, based on the exact Voigt profile we obtained, we derive the theory of resonance escape factors of plasma resonance lines, for both Lorentzian profile and Voigt profile. The oscillator strength, the number density of the absorbing atoms in the ground state, and the optical depth in the line center are discussed. As an example, the helium He I 1083.0 nm, lithium Li I 670.970 nm and carbon C I 111.74 nm are discussed for infrared, visible and ultraviolet regions. The results we calculated are in good agreement with the experimental results. These calculations will be significant in the theoretical analysis of plasma.

出版日期: 2008-09-05

引用本文:

. Theory of the resonance escape factors of plasma resonance lines basing on the exact Voigt profile[J]. Frontiers of Physics in China - Selected Publications from Chinese Universities, 2008, 3(3): 264-268.
ZHANG Qing-guo, HE Jian. Theory of the resonance escape factors of plasma resonance lines basing on the exact Voigt profile. Front. Phys. , 2008, 3(3): 264-268.

链接本文:

https://academic.hep.com.cn/fop/CN/10.1007/s11467-008-0020-4
https://academic.hep.com.cn/fop/CN/Y2008/V3/I3/264

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