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Frontiers of Physics

ISSN 2095-0462

ISSN 2095-0470(Online)

CN 11-5994/O4

邮发代号 80-965

2019 Impact Factor: 2.502

Front. Phys.   2010, Vol. 5 Issue (3): 324-329   https://doi.org/10.1007/s11467-010-0109-4
  Research articles 本期目录
Sub-diffraction-limited far-field imaging in infrared
Sub-diffraction-limited far-field imaging in infrared
Pratik CHATURVEDI,Nicholas X. FANG,
Department of Mechanical Science & Engineering, University of Illinois at Urbana-Champaign, 1206 W. Green St., Urbana, IL 61801, USA;
 全文: PDF(291 KB)  
Abstract:We investigated a far-field superlens operating at mid-infrared wavelength that allows resolving subwavelength features in the far-field. By utilizing evanescent enhancement provided by surface plasmon excitation of silver nanorods and Moiré effect, we numerically demonstrated that subwavelength information of an object can be converted to propagating information. This information can then be captured by conventional optical components. A simple image reconstruction algorithm can restore the subwavelength object. A sub-diffraction-limited resolution of 2.5 μm at 6-μm wavelength is demonstrated.
Key wordsinfrared imaging    surface plasmons    subwavelength structures metamaterials    superresolution
出版日期: 2010-09-05
 引用本文:   
. Sub-diffraction-limited far-field imaging in infrared[J]. Front. Phys. , 2010, 5(3): 324-329.
Pratik CHATURVEDI, Nicholas X. FANG, . Sub-diffraction-limited far-field imaging in infrared. Front. Phys. , 2010, 5(3): 324-329.
 链接本文:  
https://academic.hep.com.cn/fop/CN/10.1007/s11467-010-0109-4
https://academic.hep.com.cn/fop/CN/Y2010/V5/I3/324
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