One-dimensional (1-D) semiconductor nanostructures can effectively transport electrons and photons, and are considered to be promising building blocks for future optoelectronic nanodevices. In this review, we present our recent efforts to integrate optical techniques and in situ electron microscopy for comprehensively characterizing individual 1-D optoelectronic nanostructures and nanodevices. The technical strategies and their applications in “green” emission and optical confinement in 1-D ZnO nanostructures will be introduced. We also show in situ assembly and characterization of nanostructures for optoelectronic device purposes. Using these examples, we demonstrate that the combination of optical techniques and in situ electron microscopy can be powerful for the studies of optoelectronic nanomaterials and nanodevices.
. In situ characterization of optoelectronic nanostructures and nanodevices[J]. Frontiers of Physics in China, 2010, 5(4): 405-413.
Min GAO (高旻), Cheng-yao LI (李成垚), Wen-liang LI (李文亮), Xiao-xian ZHANG (张小娴), Lian-mao PENG (彭练矛). In situ characterization of optoelectronic nanostructures and nanodevices. Front Phys Chin, 2010, 5(4): 405-413.
J. B. Baxter, F. Wu, and E. S. Aydil, Appl. Phys. Lett. , 2003, 83: 3797 doi: 10.1063/1.1624467
32
X. B. Han, L. Z. Kou, X. L. Lang, J. B. Xia, N. Wang, R. Qin, J. Lu, J. Xu, Z. M. Liao, X. Z. Zhang, X. D. Shan, X. F. Song, J. Y. Gao, W. L. Guo, and D. P. Yu, Adv. Mater. , 2009, 21: 4937 doi: 10.1002/adma.200900956
33
P. M. Petroff and D. W. Lang, Appl. Phys. Lett. , 1977, 31: 60 doi: 10.1063/1.89590
34
B. G. Yacobi and D. B. Holt, Cathodoluminescence Microscopy of Inorganic Solids, New York: Springer-Verlag, 1990: 116
35
Y. Ohno and S. Takeda, Rev. Sci. Instrum. , 1995, 66: 4866 doi: 10.1063/1.1146166
36
L. J. Brillson, J. Vac. Sci. Technol. B , 2001, 19: 1762 doi: 10.1116/1.1394728
37
M. Gao, S. T. Bradley, Y. Cao, D. Jena D, Y. Lin Y, S. A. Ringel, J. Hwang, W. J. Schaff, and L. J. Brillson, J. Appl. Phys. , 2006, 100: 103512 doi: 10.1063/1.2382622
K. Vanheusden, W. L. Warren, C. H. Seager, D. R. Tallant, J. A. Voigt, and B. E. Gnade, J. Appl. Phys. , 1996, 79: 7983 doi: 10.1063/1.362349
40
A. B. Djuri?i?Y. H. Leung, K. H. Tam, Y. F. Hsu, L. Ding, W. K. Ge, Y. C. Zhong, K. S. Wong, W. K. Chan, H. L. Tam, K. W. Cheah, W. M. Kwok, and D. L. Phillips, Nanotechnology , 2007, 18: 095702
41
C. W. Chen, K. H. Chen, C. H. Shen, A. Ganguly, L. C. Chen, J. J. Wu, H. I. Wen, and W. F. Pong, Appl. Phys. Lett. , 2006, 88: 241905 doi: 10.1063/1.2211047
42
P. C. Chang, C. J. Cheien, D. Stichtenoth, C. Ronning, and J. G. Lu, Appl. Phys. Lett. , 2007, 90: 113101 doi: 10.1063/1.2712507
43
D. C. Look, G. C. Farlow, S. Limpijumnong, S. B. Zhang, and K. Nordlund, Phys. Rev. Lett. , 2005, 95: 225502 doi: 10.1103/PhysRevLett.95.225502
44
A. Janotti and C. G. Van de Walle, Appl. Phys. Lett. , 2005, 87: 122102 doi: 10.1063/1.2053360
45
M. Freitag, J. Chen, J. Tersoff, J. C. Tsang, Q. Fu, J. Liu, and P. Avouris, Phys. Rev. Lett. , 2004, 93: 076803 doi: 10.1103/PhysRevLett.93.076803
46
J. F. Wang, M. S. Gudiksen, X. F. Duan, Y. Cui, and C. M. Lieber, Science , 2001, 293: 1455 doi: 10.1126/science.1062340
47
L. Wischmeier, T. Voss, S. B?rner, and W. Schade, Appl. Phys. A , 2006, 84: 111 doi: 10.1007/s00339-006-3589-x
48
F. Qian, S. Gradecak, Y. Li, C. Y. Wen, and C. M. Liber, Nano Lett. , 2005, 5: 2287 doi: 10.1021/nl051689e
49
C. J. Barrelet, A. B. Greytak, and C. M. Lieber, Nano Lett. , 2004, 4: 1981 doi: 10.1021/nl048739k
50
L. K. van Vugt, S. Rühle, P. Ravindran, H. C. Gerritsen, L. Kuipers, and D. Vanmaekelbergh, Phys. Rev. Lett. , 2006, 97: 147401 doi: 10.1103/PhysRevLett.97.147401
51
S. Rühle, L. K. van Vugt, H. Y. Li, N. A. Keizer, L. Kuipers, and D. Vanmaekelbergh, Nano Lett. , 2008, 8: 119 doi: 10.1021/nl0721867
52
J. C. Johnson, H. Yan, P. Yang, and R. J. Saykally, J. Phys. Chem. B , 2003, 107: 8816 doi: 10.1021/jp034482n
53
T. Voss, G. T. Svacha, E. Mazur, S. Müller, C. Ronning, D. Konjhodzic, and F. Marlow, Nano Lett. , 2007, 7: 3675 doi: 10.1021/nl071958w
54
R. M. Ma, X. L. Wei, L. Dai, S. F. Liu, T. Chen, S. Yue, Z. Li, Q. Chen, and G. G. Qin, Nano Lett ., 2009, 9: 2697 doi: 10.1021/nl901190v
55
W. L. Li, M. Gao, X. X. Zhang, D. F. Liu, L. M. Peng, and S. S. Xie, Appl. Phys. Lett. , 2009, 95: 173109 doi: 10.1063/1.3257366
56
W. L. Li, M. Gao, R. Cheng, X. X. Zhang, S. S. Xie, and L. M. Peng, Appl. Phys. Lett. , 2008, 93: 023117 doi: 10.1063/1.2957982
57
X. X. Zhang, D. F. Liu, L. H. Zhang, W. L. Li, M. Gao, W. J. Ma, Y. Ren, Q. S. Zeng, Z. Q. Niu, W. Y. Zhou, and S. S. Xie, J. Mater. Chem. , 2009, 19: 962 doi: 10.1039/b815518f
58
J. C. Johnson, H. Q. Yan, P. D. Yang, and R. J. Saykally, J. Phys. Chem. B , 2003, 107: 8816 doi: 10.1021/jp034482n
59
J. Bao, M. A. Zimmler, and F. Capasso, Nano Lett. , 2006, 6: 1719 doi: 10.1021/nl061080t
60
Y. Yu, C. H. Jin, R. H. Wang, Q. Chen, and L. M. Peng, J. Phys. Chem. B , 2005, 109: 18772 doi: 10.1021/jp051294j