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Shot noise in nano-electronic systems under the perturbation
of ac fields |
| ZHAO Hong-kang |
| Department of Physics, Beijing Institute of Technology, Beijing 100081, China; |
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Abstract Current noise exists in circuits and electronic devices generally, and it exhibits specific features as the system reaches nanometer size. The noise in the nano-system where external ac fields are applied plays an important role, since the properties of the fields and the nano-system together govern the resulting noise. In this paper, we present the derivation of shot noise by employing the non-equilibrium Green s function technique. The more general formulas for the current correlation and noise spectral density are given. The system is composed of a central nano-system coupled to electrodes, and the obtained noise formulas are related to the Green s functions of detailed central regime and the terminals. As an example, we have performed the numerical calculation on a system with a toroidal carbon nanotube coupled to normal metal leads. The noise and Fano factor show intimate relation with the structure of the system and ac fields. The Aharonov-Bohm-like behaviors on the shot noise spectral density and Fano factor are observed to exhibit oscillation structures with period of quantum flux.
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Issue Date: 05 March 2007
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