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Extending the trapping lifetime of single atom in a microscopic far-off-resonance optical dipole trap |
Jun HE, Bao-dong YANG, Yong-jie CHENG, Tian-cai ZHANG, Jun-min WANG( ) |
State Key Laboratory of Quantum Optics and Quantum Optics Devices, and Institute of Opto–Electronics, Shanxi University, Taiyuan 030006, China |
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Abstract In our experiment, a single cesium atom prepared in a large-magnetic-gradient magneto–optical trap (MOT) can be efficiently transferred into a 1064-nm far-off-resonance microscopic optical dipole trap (FORT). The efficient transfer of the single atom between the two traps is used to determine the trapping lifetime and the effective temperature of the single atom in FORT. The typical trapping lifetime has been improved from ~ 6.9 s to ~ 130 s by decreasing the background pressure from ~ 1 × 10–10 Torr to ~ 2 × 10–11Torr and applying one-shot 10-ms laser cooling phase. We also theoretically investigate the dependence of trapping lifetimes of a single atom in a FORT on trap parameters based on the FORT beam’s intensity noise induced heating. Numerical simulations show that the heating depends on the FORT beam’s waist size and the trap depth. The trapping time can be predicted based on effective temperature measurement of a single atom in the FORT and the intensity noise spectra of the FORT beam. These experimental results are found to be in agreement with the predictions of the heating model.
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Keywords
magneto–optical trap (MOT)
far-off-resonance optical dipole trap (FORT)
single atom
trapping lifetime
release-and-recapture method (R&R)
effective temperature
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Corresponding Author(s):
WANG Jun-min,Email:wwjjmm@sxu.edu.cn
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Issue Date: 05 September 2011
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