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Multi-element analysis by ArF laser excited atomic fluorescence of laser ablated plumes: Mechanism and applications |
Yue Cai1, Po-Chun Chu1, Sut Kam Ho2, Nai-Ho Cheung1( ) |
| 1. Department of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong, China; 2. Faculty of Science and Technology, University of Macau, Macao, China |
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Abstract A new multi-element analysis technique based on laser-excited atomic fluorescence was reviewed. However, the one-wavelength-one-transition constraint was overcome. Numerous elements were induced to fluoresce at a single excitation wavelength of 193 nm. This was possible provided that the analytes were imbedded in dense plumes, such as those produced by pulsed laser ablation. The underlying mechanism of the technique was explained and corroborated. Analytical applications to metals, plastics, ceramics and their composites were discribed. Detection limits in the ng/g range and mass limits of atto moles were demonstrated. Several real-world problems, including the analysis of paint coating for trace lead, the non-destructive analysis of potteries and ink, the chemical profiling of electrode–plastic interfaces, and the analysis of ingestible lead colloids were discussed.
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| Keywords
laser-excited atomic fluorescence (LEAF)
argon fluoride laser
laser plume spectroscopy
multi-element analysis
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Corresponding Author(s):
Cheung Nai-Ho,Email:nhcheung@hkbu.edu.hk
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Issue Date: 01 December 2012
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