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Frontiers of Physics

ISSN 2095-0462

ISSN 2095-0470(Online)

CN 11-5994/O4

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Front. Phys.    2024, Vol. 19 Issue (3) : 33209    https://doi.org/10.1007/s11467-023-1368-1
RESEARCH ARTICLE
Optimization for epitaxial fabrication of infinite-layer nickelate superconductors
Minghui Xu1, Yan Zhao1, Xiang Ding1, Huaqian Leng1, Shu Zhang1, Jie Gong1, Haiyan Xiao1, Xiaotao Zu1, Huiqian Luo4,5, Ke-Jin Zhou3, Bing Huang2, Liang Qiao1()
1. School of Physics, University of Electronic Science and Technology of China, Chengdu 610054, China
2. Beijing Computational Science Research Center, Beijing 100193, China
3. Diamond Light Source, Harwell Campus, Didcot OX11 0DE, United Kingdom
4. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
5. Songshan Lake Materials Laboratory, Dongguan 523808, China
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Abstract

The discovery of nickelates superconductor creates exciting opportunities to unconventional superconductivity. However, its synthesis is challenging and only a few groups worldwide can obtain samples with zero-resistance. This problem becomes the major barrier for this field. From plume dynamics perspective, we found the synthesis of superconducting nickelates is a complex process and the challenge is twofold, i.e., how to stabilize an ideal infinite-layer structure Nd0.8Sr0.2NiO2, and then how to make Nd0.8Sr0.2NiO2 superconducting? The competition between perovskite Nd0.8Sr0.2NiO3 and Ruddlesden−Popper defect phase is crucial for obtaining infinite-layer structure. Due to inequivalent angular distributions of condensate during laser ablation, the laser energy density is critical to obtain phase-pure Nd0.8Sr0.2NiO3. However, for obtaining superconductivity, both laser energy density and substrate temperature are very important. We also demonstrate the superconducting Nd0.8Sr0.2NiO2 epitaxial film is very stable in ambient conditions up to 512 days. Our results provide important insights for fabrication of superconducting infinite-layer nickelates towards future device applications.

Keywords nickelate superconductivity      infinite-layer      plasma condensate      plume dynamics     
Corresponding Author(s): Liang Qiao   
Issue Date: 20 December 2023
 Cite this article:   
Minghui Xu,Yan Zhao,Xiang Ding, et al. Optimization for epitaxial fabrication of infinite-layer nickelate superconductors[J]. Front. Phys. , 2024, 19(3): 33209.
 URL:  
https://academic.hep.com.cn/fop/EN/10.1007/s11467-023-1368-1
https://academic.hep.com.cn/fop/EN/Y2024/V19/I3/33209
Fig.1  Growth process for Nd0.8Sr0.2NiO3 thin films. (a) Illustration for the CaH2 topotactic reduction, which can convert perovskite phase into infinite-layer phase. (b) RHEED diffraction spot of SrTiO3 (001) observed before growth, and (c) RHEED diffraction spot of Nd0.8Sr0.2NiO3/SrTiO3 (001) after growth (1.1 J·cm−2). (d) Oscillation curves of the RHEED intensity monitored during the growth of Nd0.8Sr0.2NiO3/SrTiO3 (001) films at different energy densities.
Fig.2  Effect of laser energy density on the structural characteristics of nickelate thin films. (a) X-ray diffraction (XRD) patterns of 15-nm-thick Nd0.8Sr0.2NiO3 (001) films grown on single-crystal SrTiO3 (001) substrates using different laser energy densities and (b) the zoomed-in view. The inset in (a) shows reciprocal space maps (RSM) of Nd0.8Sr0.2NiO3 (left) around the (103) SrTiO3 diffraction peak and the surface morphology of Nd0.8Sr0.2NiO3 (right) film by atomic force microscopy (AFM). The inset in (b) shows rocking curve FWHM values and c-axis lattice constants recorded for the (002) peak from Nd0.8Sr0.2NiO3 films grown as functions of energy laser. (c) Measured XRR of as-grown Nd0.8Sr0.2NiO3. (d) The XRD pattern of Nd0.8Sr0.2NiO2 film after reduction corresponds to the growth conditions in (a). The inset in (d) shows reciprocal space maps (RSM) of Nd0.8Sr0.2NiO2 (left) around the (103) SrTiO3 diffraction peak and the surface morphology of Nd0.8Sr0.2NiO2 (right) film by atomic force microscopy (AFM). (e) The zoomed-in view of (d). The inset in (e) shows rocking curve FWHM values and c-axis lattice constants recorded for the (002) peak from Nd0.8Sr0.2NiO2 films. (f) Measured XRR of as-grown Nd0.8Sr0.2NiO2.
Fig.3  Effect of laser energy density on transport properties and superconductivity for nickelate thin films after CaH2 reduction. The data corresponds to the transport characteristic curve of Nd0.8Sr0.2NiO2 films in (d). (a) Temperature-dependent resistivity of the CaH2 reduced Nd0.8Sr0.2NiO2 thin film grown at different laser energy densities. (b) The normal Hall coefficient RH(T) of the superconducting sample in (a).
Fig.4  Effect of substrate temperature on the structural characteristics of nickelate thin films. (a) XRD patterns of 15-nm-thick Nd0.8Sr0.2NiO3 (001) films grown on single-crystal SrTiO3 (001) substrates in the temperature range of 570−650 °C and (b) the zoomed-in view. (c) XRD patterns of 15-nm-thick Nd0.8Sr0.2NiO2 (001) films after reduction correspond in the temperature range of 570−650 °C and (d) the zoomed-in view.
Fig.5  Effect of substrate temperature on the electrical properties of nickelate thin films and superconductivity stability. (a) Temperature-dependent resistivity of Nd0.8Sr0.2NiO2 films grown in the temperature range of 570−650 °C. The inset shows the zoomed-in superconducting transition temperature. (b) Temperature dependence of resistivity for superconducting Nd0.8Sr0.2NiO2 films continuously exposed to air for 512 days, the inset shows the superconducting transition temperature for (b) plot.
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