Broadband ferromagnetic resonance studies on influence of interface bonding on magnetoeletric effects in ferrite–ferroelectric composites

doi:10.1107/s11467-011-0230-z

Front. Phys.

2012, Vol. 7

Issue (4) : 418-423 https://doi.org/10.1107/s11467-011-0230-z

RESEARCH ARTICLE

Broadband ferromagnetic resonance studies on influence of interface bonding on magnetoeletric effects in ferrite–ferroelectric composites

D. V. B. Murthy(

), Gopalan Srinivasan(

)

Physics Department, Oakland University, Rochester, MI 48309, USA

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Abstract

A systematic study has been carried out on the effects of interface bonding on the strain mediated magnetoelectric (ME) coupling in ferromagnetic–ferroelectric bilayers. The technique used involves the static electric field E tuning of the ferromagnetic resonance (FMR) in yttrium iron garnet (YIG) and lead zirconate titanate (PZT) or lead magnesium niobate-lead titanate (PMN-PT). A broad band detection technique has been developed for studies over 1-40 GHz in three types of bilayers: epoxy bonded, eutectic bonded and YIG films directly grown onto piezoelectric substrate by electrophoretic deposition. The strength A of the converse ME effect (CME) defined as the ratio of the frequency shift δf in FMR in E, A = δf/E, varies over the range 0.8 to 4.3 MHz·cm/kV, and is the highest for eutectic bonded samples and is the weakest for epoxy bonded bilayers. The results presented here as of importance for dual electric and magnetic field tunable ferrite–ferroelectric microwave resonators and filters.

Keywords ferrite ferroelectric magnetoelectric ferromagnetic resonance

Corresponding Author(s): Murthy D. V. B.,Email:murthydvb@ieee.org; Srinivasan Gopalan,Email:srinivas@oakland.edu

Issue Date: 01 August 2012

Cite this article:

D. V. B. Murthy,Gopalan Srinivasan. Broadband ferromagnetic resonance studies on influence of interface bonding on magnetoeletric effects in ferrite–ferroelectric composites[J]. Front. Phys. , 2012, 7(4): 418-423.

URL:

https://academic.hep.com.cn/fop/EN/10.1107/s11467-011-0230-z
https://academic.hep.com.cn/fop/EN/Y2012/V7/I4/418

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