|
|
|
Review of near-field optical microscopy |
| WU Shi-fa |
| Institute of Near-field Optics and Nanotechnology, Department of Physics, Dalian University of Technology, Dalian 116023, China |
|
|
|
|
Abstract This review has introduced a new near-field optical microscope (NOM) atomic force microscope combined with photon scanning tunneling microscope (AF/PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM ) has also been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM.
|
|
Issue Date: 05 September 2006
|
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
| |
Shared |
|
|
|
|
| |
Discussed |
|
|
|
|
