chapter 5 Diffraction Contrast

购物车申请加入邮件组 English

高级检索图表检索

微观组织的分析电子显微学表征（英文版）作者：Yonghua Rong　　 ISBN：978-7-04-030092-5　出版时间：2011-12-09

全书目录
本章目录

内封

版权

目录

chapter 1 Analytical Electron Microscope (AEM)

chapter 2 Specimen Preparation

chapter 3 Electron Diffraction

chapter 4 Mathematics Analysis in Electron Diffraction and Crystallography

chapter 5 Diffraction Contrast

chapter 6 High Resolution and High Spatial Resolution of Analytical Electron Microscopy

Appendix

Index
- 5.1 Classification of electron image contrasts and imaging modes
- 5.1.1 Imaging principles of mass-thickness contrast
- 5.1.2 Principle of diffraction contrast imaging
- 5.1.3 Imaging principle of phase contrast
- 5.2 Kinematical theory of diffraction contrast
- 5.2.1 Basic assumption and approximate treatment
- 5.2.2 Kinematical equation of diffraction contrast for perfect crystals
- 5.2.3 Thickness fringes and bend contours
- 5.2.4 Kinematical equation of diffraction contrast for imperfect crystals
- 5.2.5 Determination of natures of stacking fault and dislocation by diffraction contrast
- 5.3 Dynamical theory of diffraction contrast (wave-optical formulation)
- 5.3.1 Scattering of electrons from atoms
- 5.3.2 Dynamical equation and diffraction contrast for perfect crystals
- 5.3.3 Solution of the equations of the dynamical theory in perfect crystals
- 5.3.4 Bend contours and thickness fringes
- 5.3.5 Anomalous absorption effect
- 5.3.6 Dynamical equations of diffracted contrast for an imperfect crystal
- 5.3.7 Example of computer simulation of dislocations based on two-beam dynamical theory
- References

chapter 5 Diffraction Contrast

Book Metrics 引用导出

点击：次

下载：次

相关资源

相关词条