Microstructural characterization of polycrystalline materials by synchrotron X-rays
Microstructural characterization of polycrystalline materials by synchrotron X-rays
Leyun WANG1(), Meimei LI1, Jonathan ALMER2, Thomas BIELER3, Rozaliya BARABASH4
1. Nuclear Engineering Division, Argonne National Laboratory, Lemont, IL 60439, USA; 2. X-ray Science Division, Argonne National Laboratory, Lemont, IL 60439, USA; 3. Department of Chemical Engineering & Materials Science, Michigan State University, East Lansing, MI 48824, USA; 4. Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Third generation synchrotron X-rays provide an unprecedented opportunity for microstructural characterization of many engineering materials as well as natural materials. This article demonstrates the usage of three techniques for the study of structural materials: differential-aperture X-ray microscopy (DAXM), three-dimensional X-ray diffraction (3DXRD), and simultaneous wide angle/small angle X-ray scattering (WAXS/SAXS). DAXM is able to measure the 3D grain structure in polycrystalline materials with high spatial and angular resolution. In a deformed material, streaked diffraction peaks can be used to analyze local dislocation content in individual grains. Compared to DAXM, 3DXRD is able to map grains in bulk materials more quickly at the expense of spatial resolution. It is very useful for studying evolving microstructures when the materials are under deformation. WAXS/SAXS is suitable for studying materials with inhomogeneous structure, such as precipitate strengthened alloys. Structural information revealed by WAXS and SAXS can be combined for a deeper insight into material behavior. Future development and applications of these three techniques will also be discussed.
Corresponding Author(s):
WANG Leyun,Email:leyunwang@anl.gov
引用本文:
. Microstructural characterization of polycrystalline materials by synchrotron X-rays[J]. Frontiers of Materials Science, 2013, 7(2): 156-169.
Leyun WANG, Meimei LI, Jonathan ALMER, Thomas BIELER, Rozaliya BARABASH. Microstructural characterization of polycrystalline materials by synchrotron X-rays. Front Mater Sci, 2013, 7(2): 156-169.
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