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Data-driven testing methodology for RFID systems |
| An LU1,Wenbin FANG1,Shing-Chi CHEUNG1,Chang XU2,Yu LIU3, |
| 1.Department of Computer
Science and Engineering, The Hong Kong University of Science and Technology,
Hong Kong, China; 2.Department of Computer
Science and Engineering, The Hong Kong University of Science and Technology,
Hong Kong, China；Department of Computer
Science and Technology, Nanjing University, Nanjing 210093, China; 3.Institute of Automation,
Chinese Academy of Sciences, Beijing 100190, China; |
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Abstract A radio-frequency identification (RFID) system including hardware and software may be updated from time to time after first time deployment. To ensure the reliability of the system, extensive tests are required. However, enumerating all test cases is infeasible, especial- ly when the tests involve time-consuming hardware operations. To solve this problem, we propose a testing methodology for RFID systems which does not enumerate all test cases but rather those which are representative. A clustering method is adopted in selecting representative test cases. Although a small number of selected test cases are run, we can still obtain a relatively high bug detection rate compared with running the enumerated test cases. Our extensive experiments show the efficiency and effectiveness of our testing methodology.
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| Keywords
radio-frequency identification (RFID)
testing methodology
test cases
bug detection
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Issue Date: 05 September 2010
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