Magnetic properties and critical behavior of quasi-2D layered Cr<sub>4</sub>Te<sub>5</sub> thin film

doi:10.1007/s11467-022-1210-1

Front. Phys.

2023, Vol. 18

Issue (1) : 13302 https://doi.org/10.1007/s11467-022-1210-1

RESEARCH ARTICLE

Magnetic properties and critical behavior of quasi-2D layered Cr₄Te₅ thin film

Hao Liu^1,², Jiyu Fan^1,², Huan Zheng^1,², Jing Wang^1,², Chunlan Ma³, Haiyan Wang⁴, Lei Zhang⁵, Caixia Wang⁶, Yan Zhu^1,², Hao Yang^1,²(

)

¹. Department of Applied Physics, College of Physics, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China
². Key Laboratory of Aerospace Information Materials and Physics (NUAA), MIIT, Nanjing 211106, China
³. Jiangsu Key Laboratory of Micro and Nano Heat Fluid Flow Technology and Energy Application, School of Mathematics and Physics, Suzhou University of Science and Technology, Suzhou 215009, China
⁴. School of Materials Engineering, Purdue University, West Lafayette, IN 47907, USA
⁵. High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031, China
⁶. College of Physics Science and Technology, Yangzhou University, Yangzhou 225002, China

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Abstract

Quasi-2D layered Cr₄Te₅ thin film has attracted great attention because it possesses the high Curie temperature close to room temperature and relatively large saturation magnetization. However, the magnetic interactions and the nature of magnetic phase transition in the Cr₄Te₅ film have not been explored thoroughly. In this paper, we focused on the critical behavior of its magnetic phase transition through the epitaxial Cr₄Te₅ film fabricated by pulsed laser deposition (PLD). The final critical exponents β = 0.359(2) and γ = 1.54(2) were obtained by linear extrapolation together with Arrott-Noakes equation of state, and their accuracy was confirmed by using the Widom scaling relation and scaling hypothesis. We find that some magnetic disorders exist in the Cr₄Te₅ film system, which is related to Cr₄Te₅ critical behavior why its critical behavior is quite far from any conventional universality class. Furthermore, we also determined that the Cr₄Te₅ film exhibits a quasi-2D long-range magnetic interaction. Finally, the itinerant ferromagnets of Cr₄Te₅ films were confirmed by the Takahashi’s self-consistent renormalization theory of spin fluctuations. Our work provides a new idea for understanding the mechanism of magnetic interactions in similar 2D layered films.

Corresponding Author(s): Jiyu Fan,Hao Yang

Issue Date: 03 November 2022

Cite this article:

Hao Liu,Jiyu Fan,Huan Zheng, et al. Magnetic properties and critical behavior of quasi-2D layered Cr₄Te₅ thin film[J]. Front. Phys. , 2023, 18(1): 13302.

URL:

https://academic.hep.com.cn/fop/EN/10.1007/s11467-022-1210-1
https://academic.hep.com.cn/fop/EN/Y2023/V18/I1/13302

Fig.1 (a) XRD θ−2θ pattern of Cr₄Te₅ film grown on Al₂O₃ substrate. (b) XRD ϕ-scan pattern of Cr₄Te₅ (222) and Al₂O₃ (104).

Fig.2 (a) Cross-sectional TEM image and (b) high-resolution TEM image of Cr₄Te₅ and Al₂O₃ interface. (c) AFM topographic image of Cr₄Te₅ film surface. (d) Height profile obtained along the red line in (c).

Fig.3 (a) HAADF-STEM image of Cr₄Te₅ and Al₂O₃ interface. (b−e) EDS mapping of Cr, Te, Al, and O element, respectively.

Fig.4 (a) Temperature dependence of magnetization under 500 Oe applied magnetic field for Cr₄Te₅ film samples. Left inset: The dM/dT vs. T curve. Right inset: The hysteresis loops for 5?K. (b) Typical initial isothermal magnetization curves measured around T_C.

Fig.5 (a) The Arrott plot of M² vs. H/M. (b) Normalized slope (NS) of four common theoretical models as a function of temperature. (c) Temperature dependence of the spontaneous magnetization M_S (left axis) and initial inverse magnetic susceptibility

χ 0 − 1

(right axis), and the red solid lines are the fitting curves by using Eqs. (1) and (2). (d) The final modified Arrott plot [M^1/β vs. (H/M)^1/γ] at the high-field region with the critical exponents β = 0.359(2) and γ = 1.54(2).

Fig.6 (a) The coefficients A' and B' of the Arrott−Noakes equation as a function of temperature. (b) Initial isothermal magnetization curve at T = 257 K. Inset: The same curve on the log−log scale and the black solid line is the fit following Eq. (3). (c) M(H) data are plotted as renormalized magnetization (m) vs. renormalized field (h) following scaling hypothesis. Inset: The same plot on the log−log scale. (d) Effective critical exponents β_eff and γ_eff as a function of the reduced temperature ε.

Tab.1 Comparison of critical exponents of Cr₄Te₅ films with different sets of {d : n}.

Fig.7 The M⁴ vs. H/M plot for the Cr₄Te₅ film at T = 257 K.

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