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Frontiers of Electrical and Electronic Engineering

ISSN 2095-2732

ISSN 2095-2740(Online)

CN 10-1028/TM

Front. Electr. Electron. Eng.    2007, Vol. 2 Issue (2) : 172-175    https://doi.org/10.1007/s11460-007-0032-9
Document image retrieval based on multi-density features
HU Zhilan1, LIN Xinggang2, YAN Hong3
1.Department of Electronic Engineering, Tsinghua University, Beijing 100084, China; Department of Electronic Engineering, City University of Hongkong, Hongkong, China; 2.Department of Electronic Engineering, Tsinghua University, Beijing 100084, China; 3.Department of Electronic Engineering, City University of Hongkong, Hongkong, China; School of Electrical and Information Engineering, University of Sydney, NSW 2006, Australia
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Abstract The development of document image databases is becoming a challenge for document image retrieval techniques. Traditional layout-reconstructed-based methods rely on high quality document images as well as an optical character recognition (OCR) precision, and can only deal with several widely used languages. The complexity of document layouts greatly hinders layout analysis-based approaches. This paper describes a multi-density feature based algorithm for binary document images, which is independent of OCR or layout analyses. The text area was extracted after preprocessing such as skew correction and marginal noise removal. Then the aspect ratio and multi-density features were extracted from the text area to select the best candidates from the document image database. Experimental results show that this approach is simple with loss rates less than 3% and can efficiently analyze images with different resolutions and different input systems. The system is also robust to noise due to its notes and complex layouts, etc.
Issue Date: 05 June 2007
 Cite this article:   
HU Zhilan,LIN Xinggang,YAN Hong. Document image retrieval based on multi-density features[J]. Front. Electr. Electron. Eng., 2007, 2(2): 172-175.
 URL:  
https://academic.hep.com.cn/fee/EN/10.1007/s11460-007-0032-9
https://academic.hep.com.cn/fee/EN/Y2007/V2/I2/172
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