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Frontiers of Optoelectronics

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Front. Optoelectron.    2024, Vol. 17 Issue (3) : 27    https://doi.org/10.1007/s12200-024-00131-5
Exceptional point enhanced nanoparticle detection in deformed Reuleaux-triangle microcavity
Jinhao Fei, Xiaobei Zhang(), Qi Zhang, Yong Yang, Zijie Wang, Chuanlu Deng, Yi Huang, Tingyun Wang
Key Laboratory of Specialty Fiber Optics and Optical Access Networks, Joint International Research Laboratory of Specialty Fiber Optics and Advanced Communication, Shanghai Institute for Advanced Communication and Data Science, School of Communication and Information Engineering, Shanghai University, Shanghai 200444, China
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Abstract

In this paper, we propose a deformed Reuleaux-triangle resonator (RTR) to form exceptional point (EP) which results in the detection sensitivity enhancement of nanoparticle. After introducing single nanoparticle to the deformed RTR at EP, frequency splitting obtains an enhancement of more than 6 times compared with non-deformed RTR. In addition, EP induced a result that the far field pattern of chiral mode responses significantly to external perturbation, corresponding to the change in internal chirality. Therefore, single nanoparticle with far distance of more than 4000 nm can be detected by measuring the variation of far field directional emission. Compared to traditional frequency splitting, the far field pattern produced in deformed RTR provides a cost-effective and convenient path to detect single nanoparticle at a long distance, without using tunable laser and external coupler. Our structure indicates great potential in high sensitivity sensor and label-free detector.
Keywords Exceptional point      Deformed microcavity      Nanoparticle detection      Far-field pattern     
Corresponding Author(s): Xiaobei Zhang   
Issue Date: 09 September 2024
 Cite this article:   
Jinhao Fei,Xiaobei Zhang,Qi Zhang, et al. Exceptional point enhanced nanoparticle detection in deformed Reuleaux-triangle microcavity[J]. Front. Optoelectron., 2024, 17(3): 27.
 URL:  
https://academic.hep.com.cn/foe/EN/10.1007/s12200-024-00131-5
https://academic.hep.com.cn/foe/EN/Y2024/V17/I3/27
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