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Talbot effect in nonparaxial self-accelerating beams with electromagnetically induced transparency |
Jing-Min Ru1, Zhen-Kun Wu2(), Ya-Gang Zhang1, Feng Wen3(), Yu-Zong Gu1 |
1. Institute of Nano/Photon Materials and Application, School of Physics and Electronics, Henan University, Kaifeng 475004, China 2. National Demonstration Center for Experimental Physics and Electronics Education, School of Physics and Electronics, Henan University, Kaifeng 475004, China 3. Key Laboratory for Physical Electronics and Devices of the Ministry of Education & School of Science & Shaanxi Key Lab of Information Photonic Technique & Institute of Wide Bandgap Semiconductors, Xi’an Jiaotong University, Xi’an 710049, China |
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Abstract In this study, we report on the fractional Talbot effect of nonparaxial self-accelerating beams in a multilevel electromagnetically induced transparency (EIT) atomic configuration, which, to the best of our knowledge, is the first study on this subject. The Talbot effect originates from superposed eigenmodes of the Helmholtz equation and forms in the EIT window in the presence of both linear and cubic susceptibilities. The Talbot effect can be realized by appropriately selecting the coefficients of the beam components. Our results indicate that the larger the radial difference between beam components, the stronger the interference between them, the smaller the Talbot angle is. The results of this study can be useful when studying optical imaging, optical measurements, and optical computing.
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Keywords
multilevel atomic configuration
nonparaxial self-accelerating beam
Talbot effect
electromagnetically induced transparency
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Corresponding Author(s):
Zhen-Kun Wu,Feng Wen
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Just Accepted Date: 17 August 2020
Issue Date: 08 September 2020
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