Recent research situation in tin dioxide nanomaterials: synthesis, microstructures, and properties

doi:10.1007/s11706-013-0209-5

Front Mater Sci

2013, Vol. 7

Issue (3) : 203-226 https://doi.org/10.1007/s11706-013-0209-5

REVIEW ARTICLE

Recent research situation in tin dioxide nanomaterials: synthesis, microstructures, and properties

Zhi-Wen CHEN^1,2(

), Chan-Hung SHEK², C. M. Lawrence WU²(

), Joseph K. L. LAI²

1. Shanghai Applied Radiation Institute, School of Environmental and Chemical Engineering, Shanghai University, Shanghai 200444, China; 2. Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon Tong, Hong Kong, China

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Abstract

This review article summarizes the new research in solid-state physical chemistry understanding of the microstructure characteristics of semiconductor tin oxide thin films made in the last years in our group. The work mainly focuses on the fabrication technology of semiconductor tin oxides thin films by using pulsed laser deposition (PLD) as well as the application of this technology on new micro- and nanostructured materials. It is an interdisciplinary work that integrates the areas of physics, chemistry and materials science.

Keywords tin dioxide thin film synthesis microstructure nanostructure property

Corresponding Author(s): CHEN Zhi-Wen,Email:zwchen@shu.edu.cn (Z.W.C.); WU C. M. Lawrence,Email:apcmlwu@cityu.edu.hk (C.M.L.W.)

Issue Date: 05 September 2013

Cite this article:

Zhi-Wen CHEN,Chan-Hung SHEK,C. M. Lawrence WU, et al. Recent research situation in tin dioxide nanomaterials: synthesis, microstructures, and properties[J]. Front Mater Sci, 2013, 7(3): 203-226.

URL:

https://academic.hep.com.cn/foms/EN/10.1007/s11706-013-0209-5
https://academic.hep.com.cn/foms/EN/Y2013/V7/I3/203

Tab.1 Parameters of the multifractal spectra of the specimens

Fig.5 The typical morphology of the bulk-quantity highly amorphous thin films grown on Si(100) substrate is shown in SEM images at lower magnifications and higher magnifications. (Reproduced with permission from Ref. [], Copyright 2005 Springer-Verlag)

Fig.6 XRD patterns of the as-deposited thin films; XRD patterns of the as-deposited thin film heating treated at 150°C for 2 h. (Reproduced with permission from Ref. [], Copyright 2005 Springer-Verlag)

Fig.7 TEM image and SAED patterns (inset) of the as-deposited thin film heating treated at 150°C for 2 h; EDS recorded on the thin film annealing at 150°C for 2 h. (Reproduced with permission from Ref. [], Copyright 2005 Springer-Verlag)

Fig.8 The larger nanoparticle with the size of about 9 nm. The inset at the upper left-hand corner shows two smaller nanoparticles with the size of about 6 nm. (Reproduced with permission from Ref. [], Copyright 2005 Springer-Verlag)

Fig.13 TEM image of the as-prepared nanocrystalline SnO thin film; SAED pattern (inset) corresponding to the tetragonal rutile structure showing the microstructural characteristics of the polycrystalline SnO thin film. (Reproduced with permission from Ref. [], Copyright 2004 The American Physical Society)

Fig.14 XRD patterns of SnO thin films: the commercial SnO bulks; the as-prepared SnO thin film; annealing SnO thin film. (Reproduced with permission from Ref. [], Copyright 2004 The American Physical Society)

Tab.2 The relationship of the interplanar spacing () of index () in the direct lattice for different samples

Tab.3 The relationship of the lattice parameters for different samples

Fig.17 O-1s core-level X-ray photoelectron spectroscopy (XPS) analysis of SnO thin films: the as-prepared SnO thin film; annealing SnO thin film. (Reproduced with permission from Ref. [], Copyright 2004 The American Physical Society)

Fig.18 HRTEM image of the as-prepared SnO thin films shows its crystallinity; the inset at the bottom left-hand corner exhibits HRTEM image of a single SnO nanoparticle; the inset at the upper right-hand corner shows the agglomeration state of SnO nanoparticles in the as-prepared SnO thin film. (Reproduced with permission from Ref. [], Copyright 2004 The American Physical Society)

Fig.21 High-magnification HRTEM images of SnO nanocrystallites: SnO cluster composed of several nanocrystallites; initial stage of the grain growth process. (Reproduced with permission from Ref. [], Copyright 2005 Springer-Verlag)

Fig.22 Schematic representation of the formation processes concerning the nucleation, grain-rotation, coalescence, and growth of nanoclusters in the as-deposited thin film. (Reproduced with permission from Ref. [], Copyright 2005 Springer-Verlag)

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