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Two dimensional GeO2/MoSi2N4 van der Waals heterostructures with robust type-II band alignment |
Xueping Li1,2,3, Peize Yuan1, Lin Li2, Ting Liu2, Chenhai Shen2, Yurong Jiang2, Xiaohui Song2, Congxin Xia2() |
1. College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453007, China 2. Department of Physics, Henan Normal University, Xinxiang 453007, China 3. Henan Key Laboratory of Optoelectronic Sensing Integrated Application, Henan Normal University, Xinxiang 453007, China |
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Abstract Constructing two-dimensional (2D) van der Waals heterostructures (vdWHs) can expand the electronic and optoelectronic applications of 2D semiconductors. However, the work on the 2D vdWHs with robust band alignment is still scarce. Here, we employ a global structure search approach to construct the vdWHs with monolayer MoSi2N4 and wide-bandgap GeO2. The studies show that the GeO2/MoSi2N4 vdWHs have the characteristics of direct structures with the band gap of 0.946 eV and type-II band alignment with GeO2 and MoSi2N4 layers as the conduction band minimum (CBM) and valence band maximum (VBM), respectively. Also, the direct-to-indirect band gap transition can be achieved by applying biaxial strain. In particular, the 2D GeO2/MoSi2N4 vdWHs show a robust type-II band alignment under the effects of biaxial strain, interlayer distance and external electric field. The results provide a route to realize the robust type-II band alignment vdWHs, which is helpful for the implementation of optoelectronic nanodevices with stable characteristics.
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Keywords
van der Waals heterostructures
wide gap material
global structure search
robust type-II band alignment
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Corresponding Author(s):
Congxin Xia
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Issue Date: 23 November 2022
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