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Monolithically integrated long wavelength photoreceiver OEIC based on InP/InGaAs HBT technology |
Xianjie LI1( ), Yonglin ZHAO1, Daomin CAI1, Qingming ZENG1, Yunzhang PU1, Yana GUO1, Zhigong WANG2, Rong WANG3, Ming QI3, Xiaojie CHEN3, Anhuai XU3 |
1. 13th Institute of China Electronic Technology Group Corporation; 2. Institute of RF&OEICs, Southeast University; 3. Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences |
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Abstract The epitaxial structure and growth, circuit design, fabrication process and characterization are described for the photoreceiver opto-electronic integrated circuit (OEIC) based on the InP/InGaAs HBT/PIN photodetector integration scheme. A 1.55 μm wavelength monolithically integrated photoreceiver OEIC is demonstrated with self-aligned InP/InGaAs heterojunction bipolar transistor (HBT) process. The InP/InGaAs HBT with a 2 μm × 8 μm emitter showed a DC gain of 40, a DC gain cutoff frequency of 45 GHz and a maximum frequency of oscillation of 54 GHz. The integrated InGaAs photodetector exhibited a responsivity of 0.45 A/W at λ = 1.55 μm, a dark current less than 10 nA at a bias of -5 V and a -3 dB bandwidth of 10.6 GHz. Clear and opening eye diagrams were obtained for an NRZ 223-1 pseudorandom code at both 2.5 and 3.0 Gbit/s. The sensitivity for a bit error ratio of 10-9 at 2.5 Gbit/s is less than -15.2 dBm.
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Keywords
InP/InGaAs heterojunction bipolar transistor (HBT)
PIN
photoreceiver
opto-electronic integrated circuit (OEIC)
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Corresponding Author(s):
LI Xianjie,Email:xianjie@tom.com
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Issue Date: 05 September 2009
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