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Frontiers of Optoelectronics

ISSN 2095-2759

ISSN 2095-2767(Online)

CN 10-1029/TN

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Front. Optoelectron.    2015, Vol. 8 Issue (2) : 163-169    https://doi.org/10.1007/s12200-015-0463-5
RESEARCH ARTICLE
Fourier domain optical coherence tomography with ultralong depth range
Zhihua DING(),Yi SHEN,Wen BAO,Peng LI
State Key Lab of Modern Optical Instrumentation, Department of Optical Engineering, Zhejiang University, Hangzhou 310027, China
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Abstract

The depth ranges of typical implementations of Fourier domain optical coherence tomography (FDOCT), including spectral domain OCT (SDOCT) and swept source OCT (SSOCT), are limited to several millimeters. To extend the depth range of current OCT systems, two novel systems with ultralong depth range were developed in this study. One is the orthogonal dispersive SDOCT (OD-SDOCT), and the other is the recirculated swept source (R-SS) interferometer/OCT. No compromise between depth range and depth resolution is required in both systems. The developed OD-SDOCT system realized the longest depth range (over 100 mm) ever achieved by SDOCT, which is ready to be modified for depth-encoded parallel imaging on multiple sites. The developed R-SS interferometer achieved submicron precision within a depth range of 30 mm, holding potential in real-time contact-free on-axis metrology of complex optical systems.
Keywords optical coherence tomography (OCT)      virtually-imaged phased array (VIPA)      orthogonal dispersion      swept source      light recirculation      parallel imaging      dimensional metrology     
Corresponding Author(s): Zhihua DING   
Just Accepted Date: 26 January 2015   Online First Date: 10 February 2015    Issue Date: 24 June 2015
 Cite this article:   
Wen BAO,Peng LI,Zhihua DING, et al. Fourier domain optical coherence tomography with ultralong depth range[J]. Front. Optoelectron., 2015, 8(2): 163-169.
 URL:  
https://academic.hep.com.cn/foe/EN/10.1007/s12200-015-0463-5
https://academic.hep.com.cn/foe/EN/Y2015/V8/I2/163
Fig.1  (a) Schematic of OD-SDOCT system based on a virtually-imaged phased array (VIPA)-grating spectrometer; (b) detailed layout of the dispersive VIPA-grating spectrometer. SLD: super luminescent diode; CCD: charge coupled device
Fig.2  Schematic of R-SS interferometer. Coupler: 50:50 fiber coupler; PC: polarization controllers; AOFS1, 2: acousto-optic frequency shifters; SOA: semiconductor optical amplifier; CIR: circulator; OD: optical delay line; MZI: Mach–Zehnder interferometer; BPD: balanced photodetector; CH1: channel 1; CH2: channel 2; TRG: trigger channel; DAQ: data acquisition
Fig.3  Comparison imaging of a model eye by the OD-SDOCT system and conventional SDOCT system
Fig.4  Ultralong-range imaging of a steel post connected to a post holder base by the OD-SDOCT system
Fig.5  Schematic of the depth-encoded OD-SDOCT for simultaneous multi-site imaging. Ref: reference arm; L: lens; BS: beam?splitter?; MS: multi-site; M: mirror; S1,2: sample lateral locations 1,2
Fig.6  Measured profiles for a sample consisting of four interfaces in frequency domain and depth domain
location/mm optical thickness/μm standard deviation/μm
5 1779.5 0.02
10 1778.1 0.03
15 1779.3 0.14
20 1779.9 0.91
25 1779.5 0.36
30 1778.6 0.97
Tab.1  Optical thickness measurements at different locations
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