Weak localization of bismuth cluster-decorated graphene and its spin–orbit interaction

doi:10.1007/s11467-017-0677-7

Front. Phys.

2017, Vol. 12

Issue (4) : 127210 https://doi.org/10.1007/s11467-017-0677-7

RESEARCH ARTICLE

Weak localization of bismuth cluster-decorated graphene and its spin–orbit interaction

Jian-Lei Ge¹,Tian-Ru Wu²,Ming Gao³,Zhan-Bin Bai¹,Lu Cao¹,Xue-Feng Wang³,Yu-Yuan Qin¹(

),Feng-Qi Song¹(

)

¹. National Laboratory of Solid State Microstructures, Collaborative Innovation Center of Advanced Microstructures, and Department of Physics, Nanjing University, Nanjing 210093, China
². State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
³. School of Electronic Science and Engineering and National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China

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Abstract

Weak-localization (WL) measurements were performed in a Bi cluster-decorated graphene sheet. The charge concentration was kept constant, and the amplitude of the conductance correction was suppressed after the Bi-cluster deposition. Detailed WL data were obtained while the gate and temperature were changed. Using E. McCann’s formula, the spin-relaxation time was extracted, which was found to increase with the elastic scattering time. This is attributed to the Elliott–Yafet spin relaxation and Kane–Mele type spin–orbit coupling (SOC). The SOC strength was enhanced to 2.64 meV as a result of the first deposition. The coverage effect is discussed according to the measurement after the second deposition.

Keywords graphene cluster deposition weak localization spin–orbit coupling

Corresponding Author(s): Yu-Yuan Qin,Feng-Qi Song

Issue Date: 13 April 2017

Cite this article:

Jian-Lei Ge,Tian-Ru Wu,Ming Gao, et al. Weak localization of bismuth cluster-decorated graphene and its spin–orbit interaction[J]. Front. Phys. , 2017, 12(4): 127210.

URL:

https://academic.hep.com.cn/fop/EN/10.1007/s11467-017-0677-7
https://academic.hep.com.cn/fop/EN/Y2017/V12/I4/127210

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